Influence of strain on the atomic and electronic structure of manganite films
نویسندگان
چکیده
A study of the long-range, local and electronic structure of Nd0.5Sr0.5MnO3 films of varying thickness between 500 and 2000 Å has been performed. Local structure measurements at the Sr K-edge reveal a reduction of the Mn–O–Mn bond angles in films below 1000 Å. Spin-polarized measurements reveal splitting of the Mn 3d eg state in the strained region of the films and are consistent with a two-layer model for thick films with a relaxed undistorted layer on top of a strained structurally distorted layer near the substrate. r 2007 Elsevier Ltd. All rights reserved. PACS: 68.55. a; 61.10.Ht; 72.15.Gd; 61.10. i; 81.15.Fg
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